Our Dektak XT scanning stylus profilometers is capable of scanning over 100 mm distances with height sensitivity of about 1 nanometer. The instruments use either a 2µm or 12.5um diamond stylus that can be set to as light a load as 3mg. Traceable measurements can be made using our MRS-3 or MRS-4 calibration standards. We can measure flat or curved surfaces to determine Ra, Rq, Skew, etc. We can scan over very soft materials without leaving tracks. Data from the XT is all digital. |
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