Magnification Reference Standards & Stage Micrometers

Geller MicroAnalytical Laboratory offers a variety of magnification reference standards (also called stage micrometers). These are patterned devices that are placed in the sample position in optical, scanning electron, Vision Systems and all types (STM, AFM, etc.) of scanning probe microscopes. For a discussion on magnification accuracy in the SEM click here. To see an interesting application where NIST tested their molecular measurement maching (M3) using the MRS-4 click here.

For a discussion on cleaning and recertification click here.

Three different devices are currently available. They are all traceable, under our ISO-17025 scope of accreditation, to national laboratories (either NPL - National Physical Laboratory in the U.K. or NIST in the U.S.A.). By mutual recognition agreements amongst the national laboratories being traceable to one laboratory is tantamount to being traceable to another.

All of our standards are "pitch" standards which means that measurements are transferable from one type of microscopy to another. Our resource guides, available below, explain this concept in detail. Just click on the links below for the PDF files.

MRS-3 – magnifications from 10X to 50,000X. 2µm pitch minimum. Traceable to the national laboratory. For ISO-9000 and ISO-17025

MRS-4 – magnifications from 10X to 200,000X. 0.5µm pitch minimum. Traceable to the national laboratory. For ISO-9000 and ISO-17025. The new MRS-4.2 has additional 1 and 2 µm pitch patterns for compliance with ISO-16700 calibration.

MRS-5 – magnifications from 1,000X to 1,000,000X. 80nm pitch minimum. Traceable to the national laboratory. For ISO-9000 and ISO-17025

MR-1 Certificate of Measurement

 

Retainers for the MRS-3 and MRS-4

For further information click here

25φ X 3 mm SEM/ROMR26 X 44 X 3 mm

MRS SEM/R -------------------- MRS OMR

Base material: Aluminum (6061-T6 )

Finish coating: electroless nickel (≈10µm thickness)

 

 

 

 

 

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